بررسی اثر پخت بر ناهمواری سطوح لایه‌های نازک ITOتهیه شده با روش تبخیر باباریکهالکترونی از طریق تکنیک شمارش- جعبه

بررسی اثر پخت بر ناهمواری سطوح لایه های نازک itoتهیه شده با روش تبخیر باباریکهالکترونی از طریق تکنیک شمارش- جعبه

اثر بربرین در تنظیم آستروسیتهای Gfap+ ناحیه هیپوکمپ موشهای صحرایی دیابتی شده با استرپتوزوتوسین

Background: Diabetes mellitus increases the risk of central nervous system (CNS) disorders such as stroke, seizures, dementia, and cognitive impairment. Berberine, a natural isoquinolne alkaloid, is reported to exhibit beneficial effect in various neurodegenerative and neuropsychiatric disorders. Moreover astrocytes are proving critical for normal CNS function, and alterations in their activity...

اثر بربرین در تنظیم آستروسیتهای Gfap+ ناحیه هیپوکمپ موشهای صحرایی دیابتی شده با استرپتوزوتوسین

Background: Diabetes mellitus increases the risk of central nervous system (CNS) disorders such as stroke, seizures, dementia, and cognitive impairment. Berberine, a natural isoquinolne alkaloid, is reported to exhibit beneficial effect in various neurodegenerative and neuropsychiatric disorders. Moreover astrocytes are proving critical for normal CNS function, and alterations in their activity...

بررسی یکنواختی لایه نازک SiO2 ، تولید شده با روش تبخیر باریکه الکترون و تبخیر گرمایی

In this paper, SiO2 thin film is produced by two methods: at the first method, SiO2 is evaporated by the electron gun and oxygen gas is injected to compensate for oxygen loss due to dissociation. At the second method, silicon monoxide is evaporated by thermal evaporation and during the evaporation time, substrate is bombarded by the ion oxygen that produced by an ion source. The refraction inde...

اثر باز پخت بر ساختار بلوری لایه‌های نازک سولفید کادمیوم

CdS thin films were deposited by thermal evaporation in a vacuum of ~ 10-5 torr at room temperature. Samples were subjected to annealing in the range of temperatures 100-300 oC for 1 hour in air.The crystal structure of CdS films was characterized by XRD technique. Only hexagonal phase with the preferred (002) plane was found in CdS films

اندازه گیری ناهمواری سطوح با استفاده از سطح نگاری اپتیکی